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Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

PROGRESS IN ION BEAM ANALYSIS AT FUDAN UNIVERSITY

Progre- in ion beam analysis at Fudan University in the recent years is briefly reviewed. Prese ited as examples of the research activities performed in this field are TeV and 4.25 MeV helium ions fo...

Yang Fujia, Tang Jiayong

1990, 1 (1-2): 1

DATA IN THE APPLICATION OF NUCLEAR TECHNIQUES

Beginning from the proposition that availability of reliable data is necessary to the application of nuclear techniques, we explore the questions of how such data are obtained and how the extent of th...

Angela Li Scholz

1990, 1 (1-2): 10

TANDEM ACCELERATOR BASED AMS SYSTEM AND THE PROJECT AT PEKING UNIVERSTY

On the basis of general description of AMS, the advantage and development of tandem accelerator based AMS are discussed. The AMS facility at Peking University and its preliminary applications are des...

Chen Jiaer(陈佳洱) Liu Kexing (刘克新) Guo Zhiyu (郭之广) and Li Kun(李坤)

1990, 1 (1-2): 14

A SUPER SENSITIVITY MINICYCLOTRON MASS SPECTROMETER SPECIALIZED FOR CARBON—14 DATING

The structure consideration of a minicyclotron as super- sensitivity mass spectrometer for carbon-14 dating being constructed at this Institute is described. Some new design ideas and techniques are p...

Chen Maobai (陈茂柏), Li Deming (李德明), Zhang Xilin (张锡虎) Xu Senlin (徐森林), Chen Guosheng (陈国生) and Gao Wenzhao (高文照)

1990, 1 (1-2): 19

PROGRESS IN MÖSSBAUER SPECTROSCOPY

Mössbauerr effect, a nuclear analogue of resonance fluorescence, has proven to be one of the most effective experimental methods for the scientific investigation in a large variety of problems from nu...

Hia Yuanfu (夏元复)

1990, 1 (1-2): 24

ACCELERATOR- BASED ATOMIC PHYSICS AT THE LAWRENCE BERKELEY LABORATOTY: COLLISIONS OF FAST, HIGHLY- CHARGED IONS WITH ATOMS

Research on accelerator-based atomic physics at the Lawrence Berkeley Laboratory super- HILAC and Bevalac accelerators is described. This research covers several important: topics in collisions of fas...

Alfred S.Schlachter

1990, 1 (1-2): 32

LOW ENERGY INELASTIC COLLISION PROCESSES: SURFACE REACTIONS IN SPACE

The electonic transition rates in low energy ion - surface interaction were studied by emplaying tilted-foil and grazing incidence geometries, and the linear and eircular polarizations of light emitte...

N.H.Tolk, R.G.Albridge, A.V.Barnes, M.A.Albert, C.N.Sun, D.P.Russell, J.C.Tully, P.Nordlander, P.M.Savundararaj, D.HarperandJ.Benit

1990, 1 (1-2): 40

STRUCTURE EFFECTS OF SILICON AND CARBON BY CLUSTER MASS SPECTRA

Microclusters from different structures of silicon and carbon are studied by SIMS under UHV conditions in the mass range below M = 200. The sputtered mass spectra of ions Sin+, Cn+ and Cn, were obtain...

Jiang Weilin, Liu Jiarui, Liu Shurong, Zhang Delong

1990, 1 (1-2): 46

APPLICATION OF THE POSITRON ANNIHILATION TECHNIQUE

The principles of positron annihilation and four positron experimental techniques are described. The application of positron annihilation technique in material science. atomic physics and other relat...

Wang Shaojie

1990, 1 (1-2): 50

DETECTION AND DEPTH PROFILING OF 19F USING RESONANCES IN THE 19F(α,p) 22Ne REACTION

Resonances in the reaction 19F (α ,p) 2222Ne have been used to detect and depth profile 19F in solid targets. Incident alpha particles in the range 2100—2500 keV were used and protons were detected at...

L.C.MclIntyre Jr., J.A.Leavitt, M.D.Ashbaugh, B.Dezfouly — Arjomandy, Z.Lin, J.Oder, R.F.C.Farrow and S.S.P.Parkin

1990, 1 (1-2): 56

BORON PROFILING IN SILICON BY 11B(p,α) 8Be REACTION AT Ep=2.4 MeV

The reaction 11B(p, a ) 8Be was used to profile boron concentration in silicide. The energy of incident proton of 2.4 MeV was selected. The samples were Ti silicide implanted with 80 keV and 230 keV B...

Cao Jianqing, Zhu Dezhang, Yang Guohua, Liu Huizhen, Zhu Fuying, Pan Haochang

1990, 1 (1-2): 56

DEPTH PROFILING OF 1H AND/OR 4He IN SOLIDS. BY ERD WITH 19F IONS

1H or 4He depth profiling in 1H or 4He implanted silicon samples was performed by elastic recoil detection (ERD) with raulticharged 19F ions at a small accelerator. Optimization of the experimental pa...

Zhu Peiran , Liu Jiarui, Ren Mengmei , Feng Algou, Li Dawan

1990, 1 (1-2): 65

MATERIALS CHARACTERIZATION USING THE MICROBEAM AT SUNY/ALBANY

The State University of New York at Albany ion scanning microprobe has been used for materials characterization. Focused proton and helium ion beams have been used. Rutherford backscattering spectrosc...

H.Bakhru, W.G.Morris and A.Haberl

1990, 1 (1-2): 70

A NEW IXX SYSTEM AND ITS APPLICATIONS

IXX (or PIXE-induced XRF) technique gains two main advantages over conventional PIXE method. First. it can be used to avoid or significantly reduce background and spectral interferences from major ele...

Wu Xiankang, Zeng Xianzhou, Sun Yongnian, Yang Fujia

1990, 1 (1-2): 76

A COMPUTER SIMULATION OF HIGH-DOSE ION IMPLANTATION INTO AMORPHOUS MATERIALS

A computer program MACA was developed for simulating, high-dose ion implantation into amorphous solids. The topology of amorphous solids was modelled by adjusting the free flight path distribution bet...

Yuan Bo, Yu Fuchun

1990, 1 (1-2): 82

DETERMINATION OF THE SURFACE BINDING ENERGY OF A Cu/Li ALLOY BY MEASUREMENTS OF ANGULAR DISTRIBUTION OF SPUTTERED ATOMS

A copper based binary alloy containing 16.9 at % lithium has been bombarded with deuterium ions in energy range of 400 eV to 2 keV at the incidence angles of 70° and 80° away from the surface normal. ...

Wang Wenmin, J. Roth

1990, 1 (1-2): 84

COMPOSITIONAL ANALYSIS OF HIGH- TEMPERATURE SUPERCONDUCTOR THIN FILMS BY HIGH ENERGY ELASTIC BACKSCATTERING OF HELIUM IONS

High energy ion backscattering can be used to enhance the sensitivity of oxygen analysis. At He++ ion energy of 8.8 MeV, the yield due to oxygen is about 25 times larger than that predicted by Rutherf...

Wu Shiming, Cheng Huansheng, Zhang Chengteng, Yao Xiaowei, Zhao Guoging, Yang Fujia, Hua Zhongyi

1990, 1 (1-2): 89

CALCULATION AND OPTIMIZATION OF EXPERIMENTAL PARAMETERS IN ELASTIC RECOIL DETECTION (ERD)

Elastic recoil detection (ERD) proposed for the analysis of light elements in a heavier matrix is an appropriate method for its specialities. Optimization of experimental parameters in ERD such as sca...

Ren Menmei, Feng Aiguo, Zhu Peiran, Liu Jiarui, Li Dawan

1990, 1 (1-2): 93

SURFACE SEGREGATION EFFECTS IN Al2O3 IMPLANTED WITH HIGH DOSE INDIUM

Implantations of 6 x 1016 In/cm2 were performed into Implantations of 100 keV In ions to high dos a-axis oriented crystals of Al2O3 held at a liquid nitrogen temperature. The implantation produced...

Cao Dexin, D.K. Sood

1990, 1 (1-2): 99

THE STUDIES OF SURFACE LAYER ATOMIC STRUCTURE OF AL(100) BY MEV ION SCATTERING

A UHV system specially designed for studying surface and interface atomic structure by MeV ion scattering and channeling is described. The vacuum in the UHV (chamber is 133.332X 10-10Pa. The chamber i...

Cheng Huansheng (承焕生), Cui Zhixiang(崔志祥), Xu Hongjie (徐洪杰), Yao Xiaowei (要小未 ) and Yang Fujia (杨福家)

1990, 1 (1-2): 105

RBS ANALYSIS OF DAMAGE AND ANNEALING OF ION IMPLANTED InP:Fe

Rutherford backscattering spectroscopy (RBS) with channeling technique has been used to analyze the damage and its annealing of Si+ and P+ implanted InP:Fe. 150 keV Si ions and 160 keV P ions were imp...

Shen Honglie, Yang Genging, Zhou Zuyao, Zou Shichang

1990, 1 (1-2): 113

STUDY OF HYDROGEN IN ANNEALED AMORPHOUS SILICON AND IMPLANTED AMORPHOUS CARBON

Hydrogen contents and its depth profiles, obtained by nuclear reaction induced by fluorine ion, have been investigated for a series of thermal annealed amorphous silicon and implanted amorphous carbo...

Wang Yongqiang, Zheng Zhihao, Jiang Bianying

1990, 1 (1-2): 117

RESEARCH FROM ISOLATED TO COMPACT CLUSTERS

Structures and properties of both isolated and compacted clusters can be studied by SINS, RBS.NMR and Mössbauer effect. etc. Some important properties of these microclusters, such as magic numbers, is...

Wang Guanghou

1990, 1 (1-2): 121

 Nuclear Science and Techniques

ISSN: 1001-8042     eISSN: 2210-3147

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