Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556
A flexible and robust soft-error testing system for microelectronic devices and integrated circuits
WANG Xiao-Hui, TONG Teng, SU Hong, LIU Jie, ZHANG Zhan-Gang, GU Song, LIU Tian-Qi, KONG Jie, ZHAO Xing-Wen, and YANG Zhen-Lei
Nuclear Science and Techniques . 2015, (3): 30401 -030401 .  DOI: 10.13538/j.1001-8042/nst.26.030401