Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2019, Vol. 30 ›› Issue (10): 150 doi: 10.1007/s41365-019-0678-z


Development of alpha Surface Contamination Monitor Based on THGEM for contamination distribution

Si-Min XiaoZhi-Ping Luo1 Qian Liu2, 3 Guo-Jun Yuan1 Hong-Chao Pang1 Yang Liu1 Jin-Feng Huang1 Shi Chen2   

  1. 1China Institute of Atomic Energy,Beijing 100049, China
    2University of Chinese Academy of Sciences,Beijing 100049, China
    3CAS Key Laboratory of Vacuum Physics, UCAS,Beijing 100049, China
  • Received:2019-01-22 Revised:2019-04-18 Accepted:2019-05-05
  • Contact: Qian Liu
  • Supported by:
    This work was supported by the China Institute of Atomic Energy and University of Chinese Academy of Sciences, National Natural Science Foundation of China (Nos. 11575193 and U1732266), Key Research Program of Frontier Sciences, CAS (No. QYZDB-SSW-SLH039), the Youth Innovation Promotion Association of CAS (No. 2016153), and the Natural Science Key Foundation of Guangxi (No. 2015GXNSFDA139002).
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Si-Min Xiao, Zhi-Ping Luo, Qian Liu, Guo-Jun Yuan, Hong-Chao Pang, Yang Liu, Jin-Feng Huang, Shi Chen. Development of alpha Surface Contamination Monitor Based on THGEM for contamination distribution.Nuclear Science and Techniques, 2019, 30(10): 150     doi: 10.1007/s41365-019-0678-z

Abstract: In cases of high radiation emergencies, we propose a surface contamination monitor (SCM) that can quickly measure and pinpoint the contamination distribution in the affected population. Thick gaseous electron multiplier (THGEM) has several advantages, including fast response time and good spatial resolution. Based on new THGEMs, a two-dimensional imaging detector was developed for alpha detection, with a position resolution greater than 3 mm. The detector design and test results are described in this paper. Fast radiation imaging SCMs, with a 40 mm × 40 mm sensitive area, are currently under development.

Key words: THGEM detector, Surface contamination distribution, Alpha particle, Position resolution, Imaging detector