Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2016, Vol. 27 ›› Issue (5): 105 doi: 10.1007/s41365-016-0108-4

• SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS • Previous Articles     Next Articles

Iterative and accurate determination of small angle X-ray scattering background

Geng Wang 1,2,3 , Li-Feng Xu 3,4 , Jian-Lei Shen 3,4 , Guang-Bao Yao 3,4 , Zhi-Lei Ge 3,4 , Wen-Qin Li 1 , Chun-Hai Fan 1,3,4 , Gang Chen 1,2,3   

  1. 1 Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201204, China
    2 School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China
    3 CAS Key Laboratory of Interfacial Physics and Technology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201204, China
    4 Division of Physical Biology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • Contact: Gang Chen E-mail:gchen@shanghaitech.edu.cn
  • Supported by:

    This work was supported by the National Natural Science Foundation of China (No. 11375256) and the Science and Technology Commission of Shanghai Municipality (No. 14JC1493300).

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Geng Wang, Li-Feng Xu, Jian-Lei Shen, Guang-Bao Yao, Zhi-Lei Ge, Wen-Qin Li, Chun-Hai Fan, Gang Chen. Iterative and accurate determination of small angle X-ray scattering background.Nuclear Science and Techniques, 2016, 27(5): 105     doi: 10.1007/s41365-016-0108-4

Abstract:

X-ray scattering is widely used in material structural characterizations. The weak scattering nature, however, makes it susceptible to background noise and can consequently render the final results unreliable. In this paper, we report an iterative method to determine X-ray scattering background and demonstrate its feasibility by small angle X-ray scattering on gold nanoparticles. This method solely relies on the correct structural modeling of the sample to separate scattering signal from background in data fitting processes, which allows them to be immune from experimental uncertainties. The importance of accurate determination of the scaling factor for background subtraction is also illustrated.

Key words: X-ray scattering background, SAXS, Gold nanoparticles