Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2005, Vol. 16 ›› Issue (6): 343

Previous Articles     Next Articles

Sulfonated polyetherketone (SPEK-C) films investigated by positron annihilation lifetime spectroscopy and atomic force microscopy

Htwe Htwe Yin1*, YIN Ze-Jie1, TANG Shi-Biao1, HUANG Huan1, ZHU Da-Ming2   

  1. 1 Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China;
    2 Department of Physics, University of Missouri-Kansas City, Kansas City, Missouri 64110, USA
PDF ShareIt Export Citation
Htwe Htwe Yin, YIN Ze-Jie, TANG Shi-Biao, HUANG Huan, ZHU Da-Ming. Sulfonated polyetherketone (SPEK-C) films investigated by positron annihilation lifetime spectroscopy and atomic force microscopy.Nuclear Science and Techniques, 2005, 16(6): 343

Abstract: The characterization of sulfonated polyetherketone (SPEK-C) films was investigated by using positron annihilation lifetime spectroscopy (PALS) and atomic force microscopy (AFM). It was found that free volume radius and intensity depend on the variation of sulfonation degree and solvent evaporation time of the films. Pore size and distribution determined from PALS and AFM measurements showed reasonable agreement.

Key words: Atomic force microscopy (AFM), Sulfonated polyetherketone (SPEK-C), Sulfonation degree, Positron lifetime, Free volume, Pore size