Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2001, Vol. 12 ›› Issue (2): 126

Previous Articles     Next Articles

Surface contamination of the charge-coupled device

YANG Jia-Min, DING Yao-Nan, ZHENG Zhi-Jian, CHENG Jing-Xiu SUN Ke-Xu, WANG Yao-Mei, ZHANG Wen-Hai   

  1. Southwest Institute of Nuclear Physics and Chemistry, Mianyang, 621900
PDF ShareIt Export Citation
YANG Jia-Min, DING Yao-Nan, ZHENG Zhi-Jian, CHENG Jing-Xiu SUN Ke-Xu, WANG Yao-Mei, ZHANG Wen-Hai. Surface contamination of the charge-coupled device.Nuclear Science and Techniques, 2001, 12(2): 126

Abstract: An experimental method to study the influence of surface contamination of a thinned, backside illuminated charge-coupled device(CCD) upon its quantum efficiency in soft X-ray region is suggested. A transmission grating spectrometer(TGS). in which the transmission grating is coupled to a thinned, backside illuminated charge coupled device, is used to measure the continuum X-ray emission from the end of cylindrical target irradiated by laser. In the measured spectra, only the carbon K absorption edge at wavelength of 4.4nm due to condensation of the vacuum oil on the CCD surface is clearly seen. The surface contamination is considered as an effective “carbon filter” and the filter absorption to correct the quantum efficiency of the CCD camera is taken into account. The effective thickness of the carbon filter is determined by comparing the jump height of the measured spectra at 4.4nm with those of the carbon absorption coefficient curves obtained from various carbon thickness. The accuracy of this method is tested by comparing the X-ray spectrum measured by the TGS with that obtained by a soft X-ray spectrometer,

Key words: X-ray charge-coupled device (CCD), Surface contamination