Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2018 Impact factor 0.961

Nuclear Science and Techniques ›› 1995, Vol. 6 ›› Issue (3): 164

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CORRECTION OF INFLUENCE OF SUBSTRATE ON MEASUREMENT OF INNER SHELL IONIZATION CROSS SECTIONS

Luo Zhengming (罗正明), An Zhu (安 竹), He Fuqing (何福庆), Li Taihua (李泰华), Long Xianguan (龙先灌) and Peng Xiufeng (彭秀峰)   

  1. Institute of Nuclear Science and Technology, Sichuan Union University, Chengdu 610064
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Luo Zhengming (罗正明), An Zhu (安 竹), He Fuqing (何福庆), Li Taihua (李泰华), Long Xianguan (龙先灌) and Peng Xiufeng (彭秀峰). CORRECTION OF INFLUENCE OF SUBSTRATE ON MEASUREMENT OF INNER SHELL IONIZATION CROSS SECTIONS.Nuclear Science and Techniques, 1995, 6(3): 164

Abstract: The energy spectra of reflected electrons from the substrates of targets have been calculated by the bipartition model of electron transport, the contributions of the inner shell ionization events produced by the reflected electrons from the substrates in the targets to the x-ray counting in a Si(Li) detector have been estimated. It has been confirmed that, by such correction to the measured data, the experimental results of inner shell ionization cross sections by electron impact with fine precision may be obtained under the condition of thick substrate.

Key words: Inner shell ionization cross section, Bipartition model of electron transport, Target with thick substrate