Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2015, Vol. 26 ›› Issue (3): 030401 doi: 10.13538/j.1001-8042/nst.26.030401

• NUCLEAR ELECTRONICS AND INSTRUMENTATION • Previous Articles     Next Articles

A flexible and robust soft-error testing system for microelectronic devices and integrated circuits

WANG Xiao-Hui,1, 2 TONG Teng ,1, 2 SU Hong,1  LIU Jie, 1 ZHANG Zhan-Gang ,1, 2 GU Song ,1, 2 LIU Tian-Qi ,1, 2 KONG Jie ,1 ZHAO Xing-Wen,1, 2 and YANG Zhen-Lei 1, 2   

  1. 1Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
    2University of Chinese Academy of Sciences, Beijing 100049, China
  • Contact: SU Hong E-mail:suhong@impcas.ac.cn
  • Supported by:

    Supported by National Natural Science Foundation of China (Nos. 11079045, 11179003 and 11305233) and the Important Direction Project of the CAS Knowledge Innovation Program (No. KJCX2-YWN27)

WANG Xiao-Hui, TONG Teng, SU Hong, LIU Jie, ZHANG Zhan-Gang, GU Song, LIU Tian-Qi, KONG Jie, ZHAO Xing-Wen, and YANG Zhen-Lei . A flexible and robust soft-error testing system for microelectronic devices and integrated circuits.Nuclear Science and Techniques, 2015, 26(3): 030401     doi: 10.13538/j.1001-8042/nst.26.030401

Abstract:

Single event effects (SEEs) induced by radiations become a significant reliability challenge for modern electronic systems. To evaluate SEEs susceptibility for microelectronic devices and integrated circuits (ICs), an SEE testing system with flexibility and robustness was developed at Heavy Ion Research Facility in Lanzhou (HIRFL). The system is compatible with various types of microelectronic devices and ICs, and supports plenty of complex and high-speed test schemes and plans for the irradiated devices under test (DUTs). Thanks to the combination of meticulous circuit design and the hardened logic design, the system has additional performances to avoid an overheated situation and irradiations by stray radiations. The system has been tested and verified by experiments for irradiating devices at HIRFL.

Key words: SEE testing, Testing system, Single Event Effects, Soft errors, HIRFL