Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2014, Vol. 25 ›› Issue (1): 010402 doi: 10.13538/j.1001-8042/nst.25.010402

• NUCLEAR ELECTRONICS AND INSTRUMENTATION • Previous Articles     Next Articles

Radiation tolerance studies on the VA32 ASIC for DAMPE BGO calorimeter

GAO Shan-Shan , FENG Chang-Qing , JIANG Di , LIU Shu-Bin , ZHANG Zhan-Gang , XI Kai , AN Qi   

  1. 1State Key Laboratory of Particle Detection and Electronics (IHEP-USTC), Hefei 230026, China
    2Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China
    3Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
  • Contact: FENG Chang-Qing E-mail:fengcq@ustc.edu.cn
GAO Shan-Shan, FENG Chang-Qing, JIANG Di, . Radiation tolerance studies on the VA32 ASIC for DAMPE BGO calorimeter.Nuclear Science and Techniques, 2014, 25(1): 010402     doi: 10.13538/j.1001-8042/nst.25.010402

Abstract:

The Dark Matter Particle Explorer (DAMPE) is being constructed as a scientific satellite to observe high energy cosmic rays in space. As a crucial detector of DAMPE, the BGO calorimeter consists of 1848 PMT dynode signals which bring difficulties in front-end electronics on the space-limited and power-limited satellite platform. To overcome the challenge, a low-noise, low-power and high-integration ASIC chip, named VA32HDR14.2, is taken into account. In order to evaluate the radiation tolerance of the chip in space radiation environment, both single event effect (SEE) and total ionizing dose (TID) tests were performed. The SEE test result shows that the effective linear energy transfer (LET) threshold of single event latch-up (SEL) of the chip is around 23:0 MeV*cm2/mg, which is relatively sensitive, thus protection methods must be taken in the electronics design. The TID test result shows that the TID performance of the chip is higher than 25 Krad(Si), which satisfies the design specification.

Key words: Radiation effects, SEE, TID, ASIC, VA32HDR14.2