Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2011, Vol. 22 ›› Issue (4): 245-250 doi: 10.13538/j.1001-8042/nst.22.245-250

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Influencing factors on local reduction of graphene oxide with a heated AFM tip

WU Zhongliang1,2 SHEN Yue2 ZHOU Xingfei1,GUO Shouwu3 ZHANG Yi2,   

  1. 1Ningbo University,Zhejiang 315211,China 2Shanghai Institute of Applied Physics,Chinese Academy of Sciences,Shanghai 201800,China 3Research Institute of Micro/Nano Science and Technology,Shanghai Jiao Tong University,Shanghai 200240,China
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WU Zhongliang, SHEN Yue, ZHOU Xingfei, GUO Shouwu, ZHANG Yi. Influencing factors on local reduction of graphene oxide with a heated AFM tip.Nuclear Science and Techniques, 2011, 22(4): 245-250     doi: 10.13538/j.1001-8042/nst.22.245-250

Abstract:

In this paper,the factors influencing the local thermal reduction of graphene oxide (GO) sheets are investigated.The lateral force microscopy and scanning polarization force microscopy verify that the heated tips of atomic force microscope (AFM) can thermally reduce the GO into electrical conductive nanostructures.The tip temperature,heating time,and loading force applied by the AFM tip are found to have important effects on the thermal reduction of GO,while the environmental humidity is negligible.

Key words: Graphene oxide, Atomic force microscope, Heatable tip, Reduction