Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2010, Vol. 21 ›› Issue (2): 114-117 doi: 10.13538/j.1001-8042/nst.21.114-117

• NUCLEAR, HEAVY ION AND ATOMIC PHYSICS • Previous Articles     Next Articles

A thin film 10B sample for measuring the atom number

ZHANG Jiaguo WU Hao ZHANG Guohui*   

  1. State Key Laboratory of Nuclear Physics and Technology, Institute of Heavy Ion Physics, Peking University, Beijing 100871, China
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ZHANG Jiaguo, WU Hao, ZHANG Guohui. A thin film 10B sample for measuring the atom number.Nuclear Science and Techniques, 2010, 21(2): 114-117     doi: 10.13538/j.1001-8042/nst.21.114-117

Abstract:

In order to measure differential cross sections of the 10B(n,α)7Li reaction induced by MeV neutrons using the forward-backward coincidence method, a thin film 10B sample was designed and the 10B atom number was determined with a reference 10B film sample. Alpha counts of the 10B(nth,α)7Li reaction from the 10B thin film and the reference sample were measured using a gridded ionization chamber and thermal neutrons, which were moderated and thermalized by paraffin from fast neutrons produced in D(d,n)3He reaction on a 4.5 MV Van de Graaff. The neutron flux was normalized by measuring the fission yield of a small 238U fission chamber.

Key words: 10B thin film sample, Reference 10B sample, 10B atom number, Gridded ionization chamber