Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2013, Vol. 24 ›› Issue (6): 060206 doi: 10.13538/j.1001-8042/nst.2013.06.007

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Analytic fitting and simulation methods for characteristic X-ray peaks from Si-PIN detector

LI Zhe 1 TUO Xianguo 2,3,* SHI Rui 1 ZHOU Jianbin 1   

  1. 1Provincial Key Laboratory of Applied Nuclear Techniques in Geosciences, Chengdu University of Technology, Chengdu 610059, China
    2State Key Laboratory of Geohazard Prevention and Geoenvironment Protection, Chengdu University of Technology, Chengdu 610059, China
    3Southwest University of Science and Technology, Mianyang 621010, China
  • Contact: TUO Xianguo
  • Supported by:

    Supported by National Natural Science Foundation of China (Nos.40974065 and 41025015), Scientific and Technological Innovative Team in Sichuan Province (No.2011JTD0013) and "863" Program of China (No.2012AA063501).

LI Zhe, TUO Xianguo, SHI Rui, ZHOU Jianbin. Analytic fitting and simulation methods for characteristic X-ray peaks from Si-PIN detector.Nuclear Science and Techniques, 2013, 24(6): 060206     doi: 10.13538/j.1001-8042/nst.2013.06.007


A semi-empirical detector response function (DRF) model is established to fit characteristic X-ray peaks recorded in Si-PIN spectra, which is mainly composed of four components: a truncated step function, a Gaussian-shaped full-energy peak, a Gaussian-shaped Si escape peak and an exponential tail. A simple but useful statistical distribution-based analytic method (SDA) is proposed to achieve accurate values of standard deviation for characteristic X-ray peaks. And the values of the model parameters except for the standard deviation are obtained by weighted least-squares fitting of the pulse-height spectra from a number of pure-element samples. A Monte Carlo model is also established to simulate the X-ray measurement setup. The simulated flux spectrum can be transformed by Si-PIN detector response function to real pulse height spectrum as studied in this work. Finally, the fitting result for a copper alloy sample was compared with experimental spectra, and the validity of the present method was demonstrated.

Key words: X-ray fluorescence, Detector response function, Standard deviation, Si-PIN detector