Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2019, Vol. 30 ›› Issue (9): 144 doi: 10.1007/s41365-019-0655-6


Touschek lifetime study based on the precisely bunch-by-bunch BCM system at SSRF

Fang-Zhou Chen,1, 2 Zhi-Chu Chen,2, 3 Yi-Mei Zhou,1, 2 Ning Zhang,2, 3 Bo Gao,2, 3 Xing-Yi Xu,1, 2  Yong-Bin Leng1, 2, 3   

  1. 1Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
    2University of Chinese Academy of Sciences, Beijing 100049, China
    3Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201200, China
  • Received:2019-01-28 Revised:2019-04-30 Accepted:2019-05-05
  • Contact: Yong-Bin Leng
  • Supported by:
    This work was supported by the National Natural Science Foundation of China (No. 11575282) and the Ten Thousand Talent Program.
PDF ShareIt Export Citation
Fang-Zhou Chen, Zhi-Chu Chen, Yi-Mei Zhou, Ning Zhang, Bo Gao, Xing-Yi Xu, Yong-Bin Leng. Touschek lifetime study based on the precisely bunch-by-bunch BCM system at SSRF.Nuclear Science and Techniques, 2019, 30(9): 144     doi: 10.1007/s41365-019-0655-6

Abstract: Continuous tracking of bunch charges is the key to maintain stable operations in a storage ring in top-up mode. Recently, a precise bunch-by-bunch beam-current measurement (BCM) system has been developed at the Shanghai Synchrotron Radiation Facility. To avoid the influence of longitudinal oscillation on the amplitudes of the sampling points, a method called two-point equilibrium sampling is introduced. The results, obtained during routine operation time, show that the relative resolution of the measurement of the bunch charges is better than 0.02%. With this high resolution, the new BCM system is able to monitor the bunch-by-bunch beam lifetime. By using the filling pattern information, the Touschek lifetime and the vacuum lifetime can also be calculated. In this paper, the principle of the new method and the experiments is presented in detail.

Key words: Beam-current measurement, Bunch-bybunch, Touschek lifetime, Vacuum lifetime, SSRF