Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2019, Vol. 30 ›› Issue (5): 81 doi: 10.1007/s41365-019-0608-0


An APXPS endstation for gas-solid and liquid-solid interface studies at SSRF

Jun Cai1,2,3 • Qiao Dong1,3 • Yong Han2 • Bao-Hua Mao1 • Hui Zhang1 • Patrik G. Karlsson4 • John A ° hlund4 • Ren-Zhong Tai5 • Yi Yu2 • Zhi Liu1,2   

  1. 1 State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
    2 School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China
    3 University of Chinese Academy of Sciences, Beijing 100049, China
    4 Scienta Omicron, Uppsala 75228, Sweden
    5 Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai Synchrotron Radiation Facility, Shanghai 201800, China
  • Received:2019-03-26 Revised:2019-04-04 Accepted:2019-04-04
  • Contact: Zhi Liu
  • Supported by:
    This work was supported by the National Natural Science Foundation of China (No. 11227902) as part of NSFC ME2 beamline project and Science and Technology Commission of Shanghai Municipality (No. 14520722100). Y.H., Y.Y., and B.M. are supported by National Natural Science Foundation of China (Nos. 21802096, 21832004, and 11805255).
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Jun Cai, Qiao Dong, Yong Han, Baohua Mao, Hui Zhang, Patrik G. Karlsson, John Åhlund, Yi Yu, Zhi Liu. An APXPS endstation for gas-solid and liquid-solid interface studies at SSRF.Nuclear Science and Techniques, 2019, 30(5): 81     doi: 10.1007/s41365-019-0608-0

Abstract: In the past few decades, various surface analysis techniques find wide applications in studies of interfacial phenomena ranging from fundamental surface science, catalysis, environmental science and energy materials. With the help of bright synchrotron sources, many of these techniques have been further advanced into novel in-situ/ operando tools at synchrotron user facilities, providing molecular level understanding of chemical/electrochemical processes in-situ at gas–solid and liquid–solid interfaces. Designing a proper endstation for a dedicated beamline is one of the challenges in utilizing these techniques efficiently for a variety of user’s requests. Many factors, including pressure differential, geometry and energy of the photon source, sample and analyzer, need to be optimized for the system of interest. In this paper, we discuss the design and performance of a new endstation at beamline 02B at the Shanghai Synchrotron Radiation Facility for ambient pressure X-ray photoelectron spectroscopy studies. This system, equipped with the newly developed hightransmission HiPP-3 analyzer, is demonstrated to be capable of efficiently collecting photoelectrons up to 1500 eV from ultrahigh vacuum to ambient pressure of 20 mbar. The spectromicroscopy mode of HiPP-3 analyzer also enables detection of photoelectron spatial distribution with resolution of 2.8 ± 0.3 lm in one dimension. In addition, the designing strategies of systems that allow investigations in phenomena at gas–solid interface and liquid–solid interface will be highlighted through our discussion.

Key words: Ambient pressure, XPS Synchrotron, Liquid–solid interface, Spectromicroscopy