Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2019, Vol. 30 ›› Issue (5): 82 doi: 10.1007/s41365-019-0594-2


Development of readout electronics for bunch arrival-time monitor system at SXFEL

Jin-Guo Wang1,2 • Bo Liu1   

  1. 1 Shanghai Institute of Applied Physics, Chinese Academy of Science, Shanghai 201204, China
    2 University of the Chinese Academy of Science, Beijing 100049, China
  • Received:2018-08-20 Revised:2018-10-28 Accepted:2018-11-19
  • Contact: Bo Liu
  • Supported by:
    This work was supported by the National Key R&D Plan (No. 2016YFA0401900).
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Jin-Guo Wang, Bo Liu. Development of readout electronics for bunch arrival-time monitor system at SXFEL.Nuclear Science and Techniques, 2019, 30(5): 82     doi: 10.1007/s41365-019-0594-2

Abstract: A bunch arrival-time monitor (BAM) system, based on electro-optical intensity modulation scheme, is under study at Shanghai Soft X-ray Free Electron Laser. The aim of the study is to achieve high-precision time measurement for minimizing bunch fluctuations. A readout electronics is developed to fulfill the requirements of the BAM system. The readout electronics is mainly composed of a signal conditioning circuit, field-programmable gate array (FPGA), mezzanine card (FMC150), and powerful FPGA carrier board. The signal conditioning circuit converts the laser pulses into electrical pulse signals using a photodiode. Thereafter, it performs splitting and low-noise amplification to achieve the best voltage sampling performance of the dual-channel analog-to-digital converter (ADC) in FMC150. The FMC150 ADC daughter card includes a 14-bit 250 Msps dual-channel high-speed ADC, a clock configuration, and a management module. The powerful FPGA carrier board is a commercial high-performance Xilinx Kintex-7 FPGA evaluation board. To achieve clock and data alignment for ADC data capture at a high sampling rate, we used ISERDES, IDELAY, and dedicated carry-in resources in the Kintex-7 FPGA. This paper presents a detailed development of the readout electronics in the BAM system and its performance.

Key words: Bunch arrival-time monitor (BAM), Shanghai Soft X-ray Free Electron Laser (SXFEL), Field-programmable gate array (FPGA), Signal conditioning, High-speed analog-to-digital converter (ADC)