X-ray detection based on complementary metal–oxide–semiconductor sensors

doi:10.1007/s41365-018-0528-4

Nuclear Science and Techniques ›› 2019, Vol. 30 ›› Issue (1): 9 doi: 10.1007/s41365-018-0528-4

• NUCLEAR ELECTRONICS AND INSTRUMENTATION • Previous Articles Next Articles

X-ray detection based on complementary metal–oxide–semiconductor sensors

Qian-Qian Cheng¹ • Chun-Wang Ma¹ • Yan-Zhong Yuan² • Fang Wang² • Fu Jin³ • Xian-Feng Liu³

¹ College of Physics and Materials Science, Henan Normal University, Xinxiang 453007, China
² College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang 453007, China
³ Chongqing Cancer Hospital, Chongqing 400030, China

Received:2018-08-07 Revised:2018-10-23 Accepted:2018-11-23
Contact: Chun-Wang Ma E-mail:machunwang@126.com
Supported by:
This work was supported by the Plan for Science Innovation Talent of Henan Province (No. 154100510007), the Natural and Science Foundation in Henan Province (No. 162300410179) and the Cultivation Foundation of Henan Normal University National Project (No. 2017PL04).

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Qian-Qian Cheng, Chun-Wang Ma, Yan-Zhong Yuan, Fang Wang, Fu Jin, Xian-Feng Liu. X-ray detection based on complementary metal–oxide–semiconductor sensors.Nuclear Science and Techniques, 2019, 30(1): 9 doi: 10.1007/s41365-018-0528-4

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Abstract

Abstract: Complementary metal-oxide-semiconductor (CMOS) sensors can convert X-rays into detectable signals; therefore, they are powerful tools in X-ray detection applications. Herein, we explore the physics behind X-ray detection performed using CMOS sensors. X-ray measurements were obtained using a simulated positioner based on a CMOS sensor, while the X-ray energy was modified by changing the voltage, current, and radiation time. A monitoring control unit collected video data of the detected X-rays. The video images were framed and filtered to detect the effective pixel points (radiation spots). The histograms of the images prove there is a linear relationship between the pixel points and X-ray energy. The relationships between the image pixel points, voltage, and current were quantified, and the resultant correlations were observed to obey some physical laws.

Key words: X-ray detection, Simulated positioner, Complementary metal-oxide-semiconductor sensor, Effective pixel points

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X-ray detection based on complementary metal–oxide–semiconductor sensors

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