# Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2018, Vol. 29 ›› Issue (7): 103

• SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS •

### Monte Carlo simulation of incident electrons passing through thin metal layer

Tian-Long He, Hong-Liang Xu, Kai-Ting Huang, Zhi-Liang Ren, De-Rong Xu

1. National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China
• Contact: Hong-Liang Xu E-mail:hlxu@ustc.edu.cn
• Supported by:

This work was supported by the National Natural Science Foundation of China (No. 11375176).

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Tian-Long He, Hong-Liang Xu, Kai-Ting Huang, Zhi-Liang Ren, De-Rong Xu. Monte Carlo simulation of incident electrons passing through thin metal layer.Nuclear Science and Techniques, 2018, 29(7): 103
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Abstract:

A Monte Carlo simulation using two schemes, the discrete energy loss approach and the continuous slowing down approximation, was implemented in C?? to calculate the energy transmission coefficient and average energy loss for low-energy (1–10 keV) incident electrons passing through a thin metal layer. The simulation model uses the Ashley model for electron inelastic scattering, the electron elastic scattering cross section taken from the NIST database, and the stopping power derived from the full Penn algorithm. The results of the two schemes agree well with each other and can be used to quantitatively evaluate the shielding effect of a thin coated metal layer on incident electrons for a diamond amplified photocathode.