Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2018, Vol. 29 ›› Issue (1): 15 doi: 10.1007/s41365-017-0343-3


Design of fast adaptive readout system for wire scanners

Qian-Shun She 1,2 • Yi Qian 1 • Jie Kong 1 • Hai-Bo Yang 1 • Hong-Yun Zhao 1 • Jing-Zhe Zhang 1 • Xiao-Yang Niu 1,2 • Jun-Xia Wu 1 • Hong Su 1   

  1. 1 Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
    2 University of Chinese Academy of Sciences, Beijing 100049, China
  • Contact: Hong Su
  • Supported by:

    This work was supported by the National Natural Science Foundation of China (Nos. 11475233, 11705257, and 11775285).

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Qian-Shun She, Yi Qian, Jie Kong, Hai-Bo Yang, Hong-Yun Zhao, Jing-Zhe Zhang, Xiao-Yang Niu, Jun-Xia Wu, Hong Su. Design of fast adaptive readout system for wire scanners.Nuclear Science and Techniques, 2018, 29(1): 15     doi: 10.1007/s41365-017-0343-3


A new wide-range fast readout system capable of adaptive identification is designed for wire scanners, which are used to measure beam profiles and emittance. This system is capable of handling varying current signals with Gaussian distributions and current pulses up to 1000 counts/s, as well as an input current range of 1 nA–1 mA. When tested, the resolution was found to exceed 3.68% for full scale, the nonlinearity was found to be less than 0.11%, and the measurement sensibility was found to be less than 5 pA. We believe that the system will play a crucial role in improving the measurement accuracy of beam diagnosis and the efficiency of accelerator operation, as well as decreasing the time required for beam tuning. This system was applied to the beam diagnosis of an injector II prototype for an accelerator-driven subcritical system and produced excellent measurement results. A description of the adaptive fast readout system for wire scanners is presented in this paper.

Key words: Wire scanner, Weak current measurement, Adaptive identification, Front-end readout electronics, Beam diagnosis