Nuclear Science and Techniques

《核技术》(英文版) ISSN 1001-8042 CN 31-1559/TL     2019 Impact factor 1.556

Nuclear Science and Techniques ›› 2017, Vol. 28 ›› Issue (1): 13 doi: 10.1007/s41365-016-0153-z

• NUCLEAR ELECTRONICS AND INSTRUMENTATION • Previous Articles     Next Articles

Prediction of proton-induced SEE error rates for the VATA160 ASIC

Kai Xi 1,2, Di Jiang 3, Shan-Shan Gao 3, Jie Kong1, Hong-Yun Zhao1, Hai-Bo Yang1, Tian-Qi Liu1, Bin Wang1,2, Bing Ye1,2, Jie Liu 1   

  1. 1 Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
    2 University of Chinese Academy of Sciences, Beijing 100049, China
    3 State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei 230026, China
  • Contact: Jie Liu E-mail:j.liu@impcas.ac.cn
  • Supported by:

    This work was supported by the National Natural Science Foundation of China (Nos. 11179003, 10975164, 10805062, and 11005134).

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Kai Xi, Di Jiang, Shan-Shan Gao, Jie Kong, Hong-Yun Zhao, Hai-Bo Yang, Tian-Qi Liu, Bin Wang, Bing Ye, Jie Liu. Prediction of proton-induced SEE error rates for the VATA160 ASIC.Nuclear Science and Techniques, 2017, 28(1): 13     doi: 10.1007/s41365-016-0153-z
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Abstract:

We predict proton single event effect (SEE) error rates for the VATA160 ASIC chip on the Dark Matter Particle Explorer (DAMPE) to evaluate its radiation tolerance. Lacking proton test facilities, we built a Monte Carlo simulation tool named PRESTAGE to calculate the proton SEE cross-sections. PRESTAGE is based on the particle transport toolkit Geant4. It adopts a location-dependent strategy to derive the SEE sensitivity of the device from heavy-ion test data, which have been measured at the HI-13 tandem accelerator of the China Institute of Atomic Energy and the heavy-ion research facility in Lanzhou. The AP-8, SOLPRO, and August 1972 worst-case models are used to predict the average and peak proton fluxes on the DAMPE orbit. Calculation results show that the averaged proton SEE error rate for the VATA160 chip is approximately 2.17 × 10−5/device/day. Worst-case error rates for the Van Allen belts and solar energetic particle events are 1–3 orders of magnitude higher than the averaged error rate.

Key words: Proton, ASIC, Single event effects, Error rates