Effect of secondary electron non-equilibrium on the absorbed doses of CMOS device sensitive area and total ionizing dose effect
Yuankun WANG,Qian WANG,Tao WANG,Jing LIU
Nuclear Techniques . 2019, (7): 0 -070203-6 .  DOI: 10.11889/j.0253-3219.2019.hjs.42.070203