Nuclear Techniques ›› 2019, Vol. 42 ›› Issue (12): 8-12.doi: 10.11889/j.0253-3219.2019.hjs.42.120102


Simultaneous quick measurements of combined synchrotron EDXAFS and EDXRD

LIU Zhijie,LUO Zhenlin()   

  1. National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230026, China
  • Received:2019-08-12 Revised:2019-10-31 Online:2019-12-10 Published:2019-12-18
  • Contact: LUO Zhenlin
  • Supported by:
    National Key R&D Program of China(2016YFA0300102);National Natural Science Foundation of China(11675179)

Abstract: Background

X-ray absorption fine structure (XAFS) and X-ray diffraction (XRD) are the commonly used techniques to determine the short-range and long-range order of atomic arrangement in materials.


This study aims to perform XAFS and XRD measurements quickly and simultaneously for in situ kinetic structural investigation.


A method of combining synchrotron energy-dispersive X-ray absorption fine structure (EDXAFS) and energy-dispersive X-ray diffraction (EDXRD) was proposed. The white light of synchrotron radiation was used that could theoretically provide microsecond scale representation speed and time resolution.

Results & Conclusions

With a potential temporal resolution of micron seconds, this strategy provides a possibility for quick and simultaneous characterization of short- and long-range structural information of materials that sheds light on in-situ real-time investigation of structural evolution in materials in real conditions.

Key words: Energy-dispersive XAFS, Energy-dispersive XRD, Temporal resolution, Structure characterization

CLC Number: 

  • TL99