拉普拉斯算法在荧光靶光斑位置测量中的应用

doi:10.11889/j.0253-3219.2019.hjs.42.080101

Nuclear Techniques ›› 2019, Vol. 42 ›› Issue (8): 80101-080101.doi: 10.11889/j.0253-3219.2019.hjs.42.080101

• SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS • Next Articles

Application of Laplace enhancement in spot position measurement offluorescent screen imaging

Yongxiang HUA^1,²,Peirong GONG^1,³()

1. Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
2. University of Chinese Academy of Sciences, Beijing 100049, China
3. Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, China

Received:2019-03-29 Revised:2019-06-03 Online:2019-08-10 Published:2019-08-26
Contact: Peirong GONG E-mail:gongpeirong@sinap.ac.cn
About author:HUA Yongxiang, male, born in 1990, graduated from Qingdao University of Technology in 2014, master student, major in electronics and communication engineering
Supported by:
National Key R&D Program of China "Research on XFEL Principle & Key Technologies"(2016YFA0401901)

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Application of Laplace enhancement in spot position measurement offluorescent screen imaging

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