Nuclear Techniques ›› 2019, Vol. 42 ›› Issue (6): 60201-060201.doi: 10.11889/j.0253-3219.2019.hjs.42.060201


A method for material identification based on X-ray dual-energy backscatter detection

Tianming SHEN,Jiamin CHEN,Weijiao LI   

  1. The Third Research Institute of Ministry of Public Security, Shanghai 200031, China
  • Received:2019-01-24 Revised:2019-04-25 Online:2019-06-10 Published:2019-06-18
  • About author:SHEN Tianming, male, born in 1981, graduated from Fudan University in 2007, focusing on radiation imaging technology
  • Supported by:
    Supported by National Key Research and Development Program(No.2016YFC0800904)

Abstract: Background

No currently available back scatter scanning systems appear to produce colorized materials-discrimination images.


This study aims to propose a new method for material identification to throw light on detecting contraband such as metal knives, explosive devices, narcotics and so on.


X-ray dual-energy backscatter technique was employed to detect backscatter signals. Monte Carlo simulation and empirical experiments were used to determine the classification curve of material identification. By analyzing the backscatter imaging of material under test from dual-energy detectors of a backscatter scanner, material property information such as the effective atomic number was obtained. Furthers, the curves were used to colorize backscatter images of examples, referring to the high/low method on transmission technology. [Results &


By using dual-energy detectors, material identification can be realized in backscatter scanning systems. This method is greatly influenced by photon counting quantity, hence more effort should be paid on improving signal-to-noise-ratio (SNR) of the whole system accounting.

Key words: Backscatter, Material identification, Monte Carlo simulation

CLC Number: 

  • TL81