1 Hossain U H, Seidl T, Ensinger W. Combined in situ infrared and mass spectrometric analysis of high-energy heavy ion induced degradation of polyvinyl polymers[J]. Polymer Chemistry, 2014, 5(3):1001-1012. DOI:10.1039/C3PY01062G.2 Toimil-Molares M E. Characterization and properties of micro-and nanowires of controlled size, composition, and geometry fabricated by electrodeposition and ion-track technology[J]. Beilstein Journal of Nanotechnology, 2012, 3(1):860-883. DOI:10.3762/bjnano.3.97.3 Fink D, Alegaonkar P S, Petrov A V, et al. High energy ion beam irradiation of polymers for electronic applications[J]. Nuclear Instruments and Methods in Physics Research Section B:Beam Interactions with Materials and Atoms, 2005, 236(1):11-20. DOI:10.1016/j.nimb.2005.03.243.4 Apel P. Track etching technique in membrane technology[J]. Radiation Measurements, 2001, 34(1):559-566. DOI:10.1016/S1350-4487(01)00228-1.5 Wang P F, Wang M, Liu F, et al. Ultrafast ion sieving using nanoporous polymeric membranes[J]. Nature Communications, 2018, 9(1):569. DOI:10.1038/s41467-018-02941-6.6 Vetter J, Michler G H, Naumann I. Tem observation of latent tracks of heavy ions in semi-crystalline polymers[J]. Radiation Effects and Defects in Solids, 1998, 143(4):273-286. DOI:10.1080/10420159808214032.7 Ohnesorge F, Neumann R. Scanning force microscopy corrected for nm-scale sample elasticity on single latent heavy-ion tracks in polymers[J]. Europhysics Letters (EPL), 2000, 50(6):742-748. DOI:10.1209/epl/i2000-00543-x.8 Zagorski D L, Vilensky A I, Kosarev S A, et al. AFM method for investigation of irradiated polymers[J]. Radiation Measurements, 2003, 36(1):233-237. DOI:10.1016/S1350-4487(03)00130-6.9 Steckenreiter T, Fuess H, Stamm M, et al. Solvent-induced sensitization of ion tracks in PET analyzed by small-angle X-ray scattering and differential scanning calorimetry[J]. Nuclear Instruments and Methods in Physics Research Section B:Beam Interactions with Materials and Atoms, 1995, 105(1):200-203. DOI:10.1016/0168-583X(95)00553-6.10 Kuttich B, Engel M, Trautmann C, et al. Tailored nanochannels of nearly cylindrical geometry analysed by small angle X-ray scattering[J]. Applied Physics A, 2014, 114(2):387-392. DOI:10.1007/s00339-013-8167-4.11 Kluth P, Pakarinen O H, Djurabekova F, et al. Nanoscale density fluctuations in swift heavy ion irradiated amorphous SiO2[J]. Journal of Applied Physics, 2011, 110(12):123520. DOI:10.1063/1.3671614.12 Kluth P, Schnohr C S, Pakarinen O H, et al. Fine Structure in swift heavy ion tracks in amorphous SiO2[J]. Physical Review Letters, 2008, 101(17):157-173. DOI:10.1103/PhysRevLett.101.175503.13 Schnablegger H, Singh Y. The SAXS guide-getting acquainted with the principles[M]. 3rd ed. Published by Anton Paar GmbH, Printed in Austria, 2013. DOI:10.1590/S0011-52582008000100006.14 Kluth P, Johannessen B, Cookson D J, et al. SAXS and EXAFS studies of ion beam synthesized Au nanocrystals[J]. Nuclear Instruments and Methods in Physics Research Section B:Beam Interactions with Materials and Atoms, 2006, 246(1):30-34. DOI:10.1016/j.nimb.2005.12.014.15 Nadzri A, Schauries D, Afra B, et al. SAXS study on the morphology of etched and un-etched ion tracks in apatite[A]. EPJ Web of Conferences[C]. 2015, 91:00009. DOI:10.1051/epjconf/20159100009.16 Mota-Santiago P, Schauries D, Nadzri A, et al. Characterization of ion track morphology formed by swift heavy ion irradiation in silicon oxynitride films[A]. EPJ Web of Conferences[C]. 2015, 91:00008. DOI:10.1051/epjconf/20159100008.17 Pakarinen O H, Djurabekova F, Nordlund K, et al. Molecular dynamics simulations of the structure of latent tracks in quartz and amorphous SiO2[J]. Nuclear Instruments and Methods in Physics Research Section B:Beam Interactions with Materials and Atoms, 2009, 267(8-9):1456-1459. DOI:10.1016/j.nimb.2009.01.071.18 Leino A A, Daraszewicz S L, Pakarinen O H, et al. Structural analysis of simulated swift heavy ion tracks in quartz[J]. Nuclear Instruments and Methods in Physics Research B, 2014, 326(5):289-292. DOI:10.1016/j.nimb.2013.10.075.19 Schauries D, Rodriguez M D, Afra B, et al. Size characterization of ion tracks in PET and PTFE using SAXS[J]. Nuclear Instruments and Methods in Physics Research Section B:Beam Interactions with Materials and Atoms, 2015, 365:573-577. DOI:10.1016/j.nimb.2015. 08.071.20 Haubold H G, Vad T, Jungbluth H, et al. Nano structure of NAFION:a SAXS study[J]. Electrochimica Acta, 2001, 46(10-11):1559-1563. DOI:10.1016/S0013-4686(00) 00753-2.21 Hossain U H, Rodriguez M D, Schauries D, et al. SAXS investigation of un-etched and etched ion tracks in polycarbonate[J]. Nuclear Instruments and Methods in Physics Research Section B:Beam Interactions with Materials and Atoms, 2017, 409:293-297. DOI:10.1016/j.nimb.2017.04.023.22 Ziegler J F, Ziegler M D, Biersack J P. SRIM-the stopping and range of ions in matter (2010)[J]. Nuclear Instruments and Methods in Physics Research Section B:Beam Interactions with Materials and Atoms, 2010, 268(11):1818-1823. DOI:10.1016/j.nimb.2010.02.091.23 Wen Q, Wang P F, Ling Y, et al. Influence of UV-irradiation on latent tracks in polyethylene terephthalate films[J]. Chinese Physics Letters, 2016, 33(1):016103. DOI:10.1088/0256-307X/33/1/016103.24 Tian F, Li X H, Wang Y Z, et al. Small angle X-ray scattering beamline at SSRF[J]. Nuclear Science and Techniques, 2015, 26(3):030101. DOI:10.13538/j.1001-8042/nst.26.030101.25 许璐, 柏莲桂, 颜廷姿, 等. 同步辐射小角和广角X射线散射在高分子材料研究中的应用[J]. 高分子通报, 2010, (10):1-26. XU Lu, BAI Liangui, YAN Tingzi, et al. Application of synchrotron radiation small and wide angle X-ray scattering in the research of polymer materials[J]. Polymer Bulletin, 2010, (10):1-26.26 Hammersley A P. FIT2D:an introduction and overview[J]. Solid-State Fermentation Bioreactors, 1997, 8(2):1-34.27 Riedel C, Spohr R. Statistical properties of etched nuclear tracks[J]. Radiation Effects, 1979, 42(1-2):69-75. DOI:10.1080/10420157908201738. |