Nuclear Techniques ›› 2018, Vol. 41 ›› Issue (10): 100101-100101.doi: 10.11889/j.0253-3219.2018.hjs.41.100101

• SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS •     Next Articles

Research on probing the transverse coherence of the self-amplified spontaneous emission of a free-electron laser using near-field heterodyne speckle

YAO Chao1,2, CHEN Jianhui1, WANG Dong1, LI Chunlei1   

  1. 1 Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Jiading Campus, Shanghai 201800, China;
    2 University of Chinese Academy of Sciences, Beijing 100049, China
  • Received:2018-03-19 Revised:2018-05-04 Online:2018-10-10 Published:2018-10-16

Abstract: [Background] Coherence is the most striking and fundamental property of the light waves produced by X-ray free-electron lasers (XFEL). The implementation of many experimental techniques exploiting coherent radiation from XFEL requires accurate characterization of spatial properties of the radiation at the sample positon.[Purpose] This paper aims to investigate the two-dimensional transverse coherence of the self-amplified spontaneous emission (SASE) of a free-electron laser radiation based on near-field heterodyne speckle.[Methods] The laser pulse is irradiated on the nanoparticle solution making Brownian movement to produce near-field heterodyne speckle. Use a splitter to split each single pulse into two equal-amplitude pulses and two statistically independent raw images are obtained simultaneously for accurate extraction of the heterodyne speckle intensity distribution. The square root of the two-dimensional power spatial frequency spectrum of the heterodyne speckle yields the modulus of the complex coherence factor.[Results] Theoretical and simulation results proved that the accurate extraction of heterodyne signal and availability of a full two-dimensional coherence map are possible.[Conclusion] The above-mentioned method has the capability to probe the real-time coherence property of XFEL photon pulses produced from SASE mode.

Key words: Heterodyne speckle, SXFEL, Spatial coherence, Twin measurement

CLC Number: 

  • TN248.6