Nuclear Techniques ›› 2018, Vol. 41 ›› Issue (9): 90202-090202.doi: 10.11889/j.0253-3219.2018.hjs.41.090202

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Characteristics of high-and low-dose-rate radiation damage for bipolar voltage comparator

JIA Jincheng^1,2,3, LI Xiaolong^1,2,3, LU Wu^1,2, SUN Jing^1,2, WANG Xin^1,2, LIU Mohan^1,2,3, WEI Xinyu^1,2, YAO Shuai^1,2,3, GUO Qi^1,2

1 Key Laboratory of Functional Materials and Devices for Special Environments, Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi 830011, China;
2 Xinjiang Key Laboratory of Electronic Information Materials and Devices, Urumqi 830011, China;
3 University of Chinese Academy of Sciences, Beijing 100049, China

Received:2017-04-03 Revised:2017-12-10 Online:2018-09-10 Published:2018-09-12
Supported by:
Supported by National Natural Science Foundation of China (No.11605283), the West Light Foundation of Chinese Academy of Sciences (No.2016-QNXZ-B-7)

Abstract

Abstract: [Background] Bipolar junction transistors (BJTs) in spacecraft may be damaged by ionizing radiation.[Purpose] This study aims to investigate the dose rate effect and the radiation response of the voltage comparator.[Methods] Typical bipolar voltage comparators LM339 of the same batch produced by Texas Instruments (TI) are irradiated by ⁶⁰Co-γ at high-and low-dose-rate under different bias conditions. Some parameters of the voltage comparator subjected to ionization radiation, such as input bias current, open loop gain and low-level output voltage, are observed. The changing law of sensitive parameters of voltage comparator and the concrete degradation mode in the circuit level are analyzed.[Results] The degradation in performance of voltage comparator corresponding to low rate dose irradiation exhibits more dramatically enhancement, i.e. enhanced low dose rate sensitivity.[Conclusions] The radiation response of the voltage comparator is severely affected by the bias conditions.

Key words: Bipolar voltage comparator, ⁶⁰Co-γ irradiation, Dose rate effect

CLC Number:

TL99

JIA Jincheng, LI Xiaolong, LU Wu, SUN Jing, WANG Xin, LIU Mohan, WEI Xinyu, YAO Shuai, GUO Qi. Characteristics of high-and low-dose-rate radiation damage for bipolar voltage comparator[J].Nuclear Techniques, 2018, 41(9): 90202-090202.

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