Nuclear Techniques ›› 2018, Vol. 41 ›› Issue (8): 80101-080101.doi: 10.11889/j.0253-3219.2018.hjs.41.080101

• SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS •     Next Articles

Slit separation rapid scanning system for synchrotron radiation interferometer

GAO Bo1,2, LENG Yongbin1,2, CHEN Hanjiao1,2, CHEN Jie1,2   

  1. 1. Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Jiading Campus, Shanghai 201800, China;
    2. University of Chinese Academy of Sciences, Beijing 100049, China
  • Received:2018-04-10 Revised:2018-05-04 Online:2018-08-10 Published:2018-08-15
  • Supported by:
    Supported by National Natural Science Foundation of China (No.11375255)

Abstract: [Background] Spatial interferometer technology is widely used to measure the transverse beam size of synchrotron radiation around the world. The interferometer usually uses double-slit with fixed slit separation. However, this method is only suitable for measurements with relatively small changes in beam size. With the development of the diffraction limited storage ring, the demand for high-precision measurement is becoming more and more urgent. Multi-frequency coherence measurement can overcome these limitations, but it is limited by the changing speed of double-slit.[Purpose] This study aims to improve the speed of multi-frequency coherence measurement by establishment of a slit separation rapid scanning system at Shanghai synchrotron radiation facility (SSRF).[Methods] Superimposed double single-slit is employed as the new double-slit mask in this system, and multi-thread technology is used to do fast data processing.[Results] The experimental results show that the time for one complete 10 points measurement is less than 3s with better accuracy compared with the traditional interferometer.[Conclusion] The new system greatly improves the speed of the multi-frequency coherence measurement and outperform the existing interferometer in terms of accuracy.

Key words: Spatial interferometer, Synchrotron radiation facility, Transverse beam size, Emittance, Silt spacing rapid scanning system

CLC Number: 

  • TL506.6