Nuclear Techniques ›› 2016, Vol. 39 ›› Issue (4): 40102-040102.doi: 10.11889/j.0253-3219.2016.hjs.39.040102


Design and simulation of bunch length measurement with electro-optical spectral decoding at SDUV-FEL

HUA Lianfa1,2, ZHANG Wenyan2, WANG Xingtao2, LI Zhen1, LIU Bo2   

  1. 1 Environmental and Chemical Engineering, Shanghai University, Shanghai 200444, China;
    2 Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Jiading Campus, Shanghai 201800, China
  • Received:2016-01-20 Revised:2016-03-08 Online:2016-04-10 Published:2016-04-08
  • Supported by:

    Supported by National Natural Science Foundation of China(No.11322550)


Background: The longitudinal length of electron bunch is an important parameter in beam diagnostics. Electro-Optical Spectral Decoding(EOSD) is one of the few powerful approaches to accurately measure bunches down to sub-picosecond level. Purpose: This study aims to design and evaluate a complete system to measure the bunch length at Shanghai Deep Ultraviolet Free Electron Laser(SDUV-FEL). Methods: The EOSD with a probe used for coarse synchronization and a tunable grating pair used as laser stretcher was designed, and the processes of Electro-Optical modulation and detection were simulated in detail. Results: The bunch length varying from 1 ps to 10ps can be measured without beam destruction in the whole process. The time resolution(Root Mean Square, RMS) is expected up to 180 fs at best and signal broadening within 3%. Conclusion: The longitudinal bunch length can be measured with high quality utilizing our EOSD setup. The system can meet the demands of SDUV-FEL.

Key words: Bunch length, EOSD, Coulomb field, Broadening and distortion, Beam diagnostics

CLC Number: 

  • TL506