Nuclear Techniques ›› 2015, Vol. 38 ›› Issue (10): 100103-100103.doi: 10.11889/j.0253-3219.2015.hjs.38.100103

• SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS • Previous Articles     Next Articles

Study on beam loss system of BEPCII

HE Jun ZHAO Xiaoyan WANG Lin DU Yaoyao ZHAO Ying SUI Yanfeng YUE Junhui CAO Jianshe   

  1. (Key Laboratory of Particle Acceleration Physics and Technology, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China)
  • Received:2015-04-10 Revised:2015-08-29 Online:2015-10-10 Published:2015-10-14

Abstract: Background: A beam loss system that uses the PIN diode as the detector has been set up on Beijing Electron–Positron Collider II (BEPCII) storage after 8-a routine operation. Further study and analysis should been carried out based on the historical data. Purpose: This study aims to learn the beam loss process in depth and further optimize the parameters of the accelerator. Methods: Based on the machine size and beam parameter of BEPCII, the Monte Carlo simulation of the cluster electrons in the storage ring was performed to provide reference for installation position of the beam loss system. Then different methods, including adding all the beam loss monitor (BLM) counts, adding the inner detector, adding the outer detector, have been used for data analysis of the beam life time, beam loss distribution, beam envelope and dispersion, etc., under both the collider mode and synchrotron mode. Results: The results show that the BLM system is useful to study the beam life time and diagnose the beam loss processes. The beam loss system for BEPCII works stablely. The detector counts are much smaller than the dynamic range of the detector. Conclusion: Over the eight years, the response of the beam loss system does not change a lot, which implies that the radiation tolerance of beam loss system is very good. Lower than expected detector counts show that the detectors position needs to be optimized, the sensitivity is not enough. The beam loss system is an effective method to study the “dust” effect.

Key words: Diode, Beam loss, Storage ring, Beam life time