Journal of Radiation Research and Radiation Proces ›› 2012, Vol. 30 ›› Issue (3): 178-182.doi: 10.11889/j.1000-3436.2012.rrj.30.120310

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Study on dose-response characteristics with amorphous silicon electronic portal imaging device

SUN Yanze  MIAO Li  YIN Xujun  TAN Youheng  WEN Wanxin   

  1. (School of Radiation Medicine and protection, Medical College of Soochow University, Jiangsu Provincial Key Laboratory of Radiation Medicine and Protection , Suzhou 215123, China)
  • Received:2011-11-10 Revised:2012-01-11 Online:2012-06-20 Published:2014-09-11


The object of this study is to investigate the dose-response characteristics of an amorphous silicon electronic portal imaging device (a-Si EPID). An in-housing developed DVS(Dosimetric verifying system) software was used to analysis the portal image captured in different conditions, and the relationship of pixel value with dose, field size, dose rate, readout signal variation in different binning mode, gain mode and integration time setting was investigated. The EPID showed an excellent temporal stability on short time .Ghosting effects could increase the sensitivity of the EPID and became more pronounced with decrement of time intervals between two exposures as well as with increment of dose though the EPID response is linear with dose. However, it will be ideal for dosimetry application if some corrections for scatter could be made.

Key words: Electronic portal imaging device, A-Si EPID, Dose-response characteristics

CLC Number: 

  • TL814,R144.1